2014
Follow‐Up of the Patient with a CIED
Doppalapudi H, Blitzer M, Schoenfeld M. Follow‐Up of the Patient with a CIED. 2014, 453-503. DOI: 10.1002/9781118459553.ch11.Peer-Reviewed Original Research
2001
Unexpected ICD Pulse Generator Failure Due to Electronic Circuit Damage Caused by Electrical Overstress
HAUSER R, HAYES D, ALMQUIST A, EPSTEIN A, PARSONNET V, TYERS G, VLAY S, SCHOENFELD M. Unexpected ICD Pulse Generator Failure Due to Electronic Circuit Damage Caused by Electrical Overstress. Pacing And Clinical Electrophysiology 2001, 24: 1046-1054. PMID: 11475818, DOI: 10.1046/j.1460-9592.2001.01046.x.Peer-Reviewed Original ResearchConceptsAdverse event reportsPulse generator failuresSerious adverse eventsUser Facility Device Experience (MAUDE) databaseMulticenter registryAdverse eventsRoutine followICD functionLead failureExternal defibrillationFDA ManufacturerEvent reportsRegistryIncidenceICDLoss of telemetryExperience databaseLifesaving devicesPacemakerFailureSigns of failureElectrosurgical device