SU‐E‐T‐100: The Influence Edge Electrons in Small Fields: Emphasis by the Difference of Copper‐Cerrobend Cutout
Chu A, Deng J, Feng W, Chen Z, Ahmad M, Nath R. SU‐E‐T‐100: The Influence Edge Electrons in Small Fields: Emphasis by the Difference of Copper‐Cerrobend Cutout. Medical Physics 2013, 40: 226-226. DOI: 10.1118/1.4814535.Peer-Reviewed Original ResearchCerrobend cutoutsEdge electronsFilm dosimetry techniquesSurface of phantomMonte Carlo calculationsVarian acceleratorPDD curvesElectron scatteringDose profilesDose outputElectron energyEnergy spectrumPrimary electronsDosimetry techniquesElectron beamBeam-qualityPhoton transmissionMonte Carlo simulationsSmall fieldsEdge scatteringChamber measurementsNarrow widthBremsstrahlungCerrobendElectron