Neural Circuit Markers of Familial Risk for Depression Among Healthy Youths in the Adolescent Brain Cognitive Development Study
Holt-Gosselin B, Keding T, Poulin R, Brieant A, Rueter A, Hendrickson T, Perrone A, Byington N, Houghton A, Miranda-Dominguez O, Feczko E, Fair D, Joormann J, Gee D. Neural Circuit Markers of Familial Risk for Depression Among Healthy Youths in the Adolescent Brain Cognitive Development Study. Biological Psychiatry Cognitive Neuroscience And Neuroimaging 2023, 9: 185-195. PMID: 37182734, PMCID: PMC10640659, DOI: 10.1016/j.bpsc.2023.05.001.Peer-Reviewed Original ResearchFamilial riskHR youthLR youthHealthy youthWhole-brain seedEarly-onset depressionResting-state FCYears of ageBrain-based markersFunctional connectivity patternsHigh familial riskCognitive Development StudyAdolescent Brain Cognitive Development (ABCD) studyMaternal riskLow familial riskMaternal historyFamily historyStriatal connectivityMaternal depressionDepression riskNucleus accumbensPsychiatric problemsNeural circuitsEarly detectionSmall sample size