2015
Direct Imaging of Charge Transport in Progressively Reduced Graphene Oxide Using Electrostatic Force Microscopy
Yalcin SE, Galande C, Kappera R, Yamaguchi H, Martinez U, Velizhanin KA, Doorn SK, Dattelbaum AM, Chhowalla M, Ajayan PM, Gupta G, Mohite AD. Direct Imaging of Charge Transport in Progressively Reduced Graphene Oxide Using Electrostatic Force Microscopy. ACS Nano 2015, 9: 2981-2988. PMID: 25668323, DOI: 10.1021/nn507150q.Peer-Reviewed Original ResearchElectrostatic force microscopyGraphene oxideOptical propertiesDirect imagingThin-film optoelectronic applicationsForce microscopyEFM measurementsOptoelectronic propertiesCharge transportDevelopment of GOQuantum chemistry calculationsOptical spectroscopyGood electrical conductivityOptoelectronic devicesOptoelectronic applicationsFlexible thin filmsPhotoluminescence imagingChemistry calculationsThin filmsPhase transitionTheoretical modelingMultifunctional materialsPotential barrierBulk quantitiesCharge propagation
2012
Electrostatic Force Microscopy and Spectral Studies of Electron Attachment to Single Quantum Dots on Indium Tin Oxide Substrates
Yalcin S, Yang B, Labastide J, Barnes M. Electrostatic Force Microscopy and Spectral Studies of Electron Attachment to Single Quantum Dots on Indium Tin Oxide Substrates. The Journal Of Physical Chemistry C 2012, 116: 15847-15853. DOI: 10.1021/jp305857d.Peer-Reviewed Original ResearchQuantum dotsElectron attachmentQuantum-confined Stark effectIndividual CdSe/ZnS quantum dotsEFM measurementsElectrostatic force microscopy (EFM) studyMeV red shiftSingle quantum dotIndividual quantum dotsElectrostatic force microscopyOxide substratesTin-doped indium oxide (ITO) substratesRemoval of electronsForce microscopy studiesCdSe/ZnS quantum dotsIndium tin oxide (ITO) substrateFermi level mismatchStark effectUnambiguous signatureZnS quantum dotsTin oxide substratesRecombination energyPhotoluminescence imagingSpectral modulationExcess electrons