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Publications, Book Chapters & Patents

Publications

Book Chapters

Pang, S*. & Xu, C. S. Methods of enhanced FIB-SEM sample preparation and image acquisition. In: Methods in Cell Biology: Volume Electron Microscopy Volume 181 (ed. Verkade P. et al.). https://doi.org/10.1016/bs.mcb.2023.01.019

Xu CS*, Pang S, Hayworth KJ, Hess HF. Transforming FIB-SEM Systems for Large-Volume Connectomics and Cell Biology. In: Wacker I, Hummel E, Burgold S, Schröder R, editors. Volume Microscopy Neuromethods, vol 155. New York: Humana: 2020; p. 221-243. https://doi.org/10.1007/978-1-0716-0691-9_12

* Corresponding author

Selected Patents

  • Hayworth KJ, Hess HF, Xu CS, Peale D. Volume scanning electron microscopy of serial thick tissue sections with gas cluster milling. US Patent No. 11,177,110, November, 2021.
  • Xu CS, Hayworth KJ, Hess HF. Enhanced FIB-SEM systems for large-volume 3D imaging. US Patent No. 10,600,615, March, 2020.
  • Yang H, Cang H, Xu CS, Wong CM. Single nanoparticle tracking spectroscopic microscope. US Patent No. 7,982,194, July, 2011.
  • de la Llera A, Pham X, Xu CS, Wei D, Luong T. Air platen for leading edge and trailing edge control. US Patent No. 7,018,276, March, 2006.
  • Yi J, Xu CS. Neural network control of chemical mechanical planarization. US Patent No. 7,001,243, February, 2006.
  • Taylor TR, Xu CS. Apparatus for edge polishing uniformity control. US Patent No. 6,991,512, January, 2006.
  • Majumder SA, Xu CS, Chen Z. Methods for reducing slurry usage in a linear chemical mechanical planarization system. US Patent No. 6,953,391, October, 2005.
  • Xu CS, Zhao EY, Dai F. Methods for making reinforced wafer polishing pads and apparatuses implementing the same. US Patent No. 6,949,020, September, 2005.
  • Yi J, Xu CS. Methods for monitoring and controlling chemical mechanical planarization. US Patent No. 6,931,330, August, 2005.
  • Yi J, Xu CS. End point detection with imaging matching in semiconductor processing. US Patent No. 6,930,782, August, 2005.
  • Xu CS, Wu P, Pham X. Molded end point detection window for chemical mechanical planarization. US Patent No. 6,806,100, October, 2004.
  • Taylor TR, Xu CS. Fluid conserving platen for optimizing edge polishing. US Patent No. 6,790,128, September, 2004.
  • de la Llera A, Pham X, Xu CS, Wei D, Luong T. Air platen for leading edge and trailing edge control. US Patent No. 6,761,626, July, 2004.
  • Xu CS, Gasparitsch J, Taff R, Bahng KJ, Stasiewicz P, Engdahl EH. Apparatus for controlling leading edge and trailing edge polishing. US Patent No. 6,729,945, May, 2004.
  • Taylor TR, Xu CS, Crofton KT, Zhao EY. Platen assembly having a topographically altered platen surface. US Patent No. 6,712,679, March, 2004.
  • Xu CS, Lombardo BS. Unsupported chemical mechanical polishing belt. US Patent No. 6,656,030, December, 2003.
  • Xu CS. Grooved rollers for a linear chemical mechanical planarization system. US Patent No. 6,620,035, September, 2003.
  • Xu CS, Zhao EY, Dai F. Methods for making reinforced wafer polishing pads utilizing direct casting and apparatuses implementing the same. US Patent No. 6,572,463, June, 2003.
  • Xu CS, Zhao EY, Dai F. Methods for making reinforced wafer polishing pads and apparatuses implementing the same. US Patent No. 6,561,889, May, 2003.
  • Xu CS, Zhao Y. Method and system for measuring threshold length. US Patent No. 6,552,812, April, 2003.
  • Pang S, Tong L, Dong Z, Lin K, Hsiang J, Data storage and retrieval apparatus with thin film read head having planarized extra gap and shield layers and method of fabrication thereof, US Patent 6,496,334, December 17, 2002.
  • Xu CS, Lombardo BS. Unsupported chemical mechanical polishing belt. US Patent No. 6,406,363, June, 2002.
  • Wang L, Shi Z, Hossain S, Pang S, Advanced pole trim writer with moment P1 and low apex angle, US Patent 6,317,290, November 13, 2001.
  • Jensen A, Xu CS. Method of optimizing chemical mechanical planarization process. US Patent No. 6,315,634, November, 2001.