2012
Natural history of the Sprint Fidelis lead: survival analysis from a large single-center study
Tzogias L, Bellavia D, Sharma S, Donohue TJ, Schoenfeld MH. Natural history of the Sprint Fidelis lead: survival analysis from a large single-center study. Journal Of Interventional Cardiac Electrophysiology 2012, 34: 37-44. PMID: 22314669, DOI: 10.1007/s10840-011-9647-0.Peer-Reviewed Original ResearchConceptsLead Integrity AlertFidelis leadInappropriate shocksLead failureIndependent predictorsDouble-peaked patternLarge single-center studyLarge single-center cohortNatural historyLead survival ratesSingle-center cohortSingle-center experienceSingle-center studyLead failure rateSprint Fidelis leadFidelis lead failureMethodsAll patientsLead survivalResultsA totalSurvival analysisSurvival rateMultivariate analysisPatientsConclusionsThis studyPrior reports
2001
Unexpected ICD Pulse Generator Failure Due to Electronic Circuit Damage Caused by Electrical Overstress
HAUSER R, HAYES D, ALMQUIST A, EPSTEIN A, PARSONNET V, TYERS G, VLAY S, SCHOENFELD M. Unexpected ICD Pulse Generator Failure Due to Electronic Circuit Damage Caused by Electrical Overstress. Pacing And Clinical Electrophysiology 2001, 24: 1046-1054. PMID: 11475818, DOI: 10.1046/j.1460-9592.2001.01046.x.Peer-Reviewed Original ResearchConceptsAdverse event reportsPulse generator failuresSerious adverse eventsUser Facility Device Experience (MAUDE) databaseMulticenter registryAdverse eventsRoutine followICD functionLead failureExternal defibrillationFDA ManufacturerEvent reportsRegistryIncidenceICDLoss of telemetryExperience databaseLifesaving devicesPacemakerFailureSigns of failureElectrosurgical device