Val/Met BDNF as a genetic risk for a false sense of security in post-discharge suicide risk
Rufino K, Goli P, Patriquin M, Kosten T, Nielsen D, Salas R. Val/Met BDNF as a genetic risk for a false sense of security in post-discharge suicide risk. Journal Of Affective Disorders 2024, 354: 98-103. PMID: 38447916, DOI: 10.1016/j.jad.2024.03.001.Peer-Reviewed Original ResearchSuicide riskAssociated with suicide riskHigher risk of suicide attemptRisk of suicide attemptSuicidal ideation levelsMet variantSuicidal ideation scoresHigh riskPost-discharge suicidesPsychiatric inpatient carePost-discharge periodPsychiatric inpatientsIdeation scoresSuicidal ideationSuicide attemptsInpatient treatmentNo significant associationAssociated with such riskInpatient careDiverse sampleSuicideBDNFIdeational levelGenetic riskInpatients