Electrostatic Screening of Charged Defects in Monolayer MoS2
Atallah T, Wang J, Bosch M, Seo D, Burke R, Moneer O, Zhu J, Theibault M, Brus L, Hone J, Zhu X. Electrostatic Screening of Charged Defects in Monolayer MoS2. The Journal Of Physical Chemistry Letters 2017, 8: 2148-2152. PMID: 28448150, DOI: 10.1021/acs.jpclett.7b00710.Peer-Reviewed Original ResearchTransition-metal dichalcogenidesCharged defectsUnintentional dopingMonolayer MoS<sub>2</sub>Monolayer transition-metal dichalcogenidesIonic liquidsNonradiative recombination centersCharge-carrier trappingMonolayer MoS2Presence of ionic liquidsRecombination centersNonradiative recombinationOptoelectronic technologiesPL enhancementCharge-carrierElectrostatic screeningMonolayerDopingPhotoluminescenceDichalcogenidesMoS2DefectsBrightnessMOSTraps