Enhanced FIB-SEM systems for large-volume 3D imaging
Xu CS, Hayworth KJ, Lu Z, Grob P, Hassan AM, García-Cerdán JG, Niyogi KK, Nogales E, Weinberg RJ, Hess HF. Enhanced FIB-SEM systems for large-volume 3D imaging. ELife 2017, 6: e25916. PMID: 28500755, PMCID: PMC5476429, DOI: 10.7554/elife.25916.Peer-Reviewed Original ResearchConceptsFIB-SEM systemFocused Ion Beam Scanning Electron MicroscopyIon beam scanning electron microscopyBeam scanning electron microscopyLong-term system stabilityScanning electron microscopyNovel high-resolution techniqueSystem stabilityFIB-SEMElectron microscopyHigh resolutionHigh-resolution techniquesSmall volume