Electrostatic Force Microscopy and Spectral Studies of Electron Attachment to Single Quantum Dots on Indium Tin Oxide Substrates
Yalcin S, Yang B, Labastide J, Barnes M. Electrostatic Force Microscopy and Spectral Studies of Electron Attachment to Single Quantum Dots on Indium Tin Oxide Substrates. The Journal Of Physical Chemistry C 2012, 116: 15847-15853. DOI: 10.1021/jp305857d.Peer-Reviewed Original ResearchQuantum dotsElectron attachmentQuantum-confined Stark effectIndividual CdSe/ZnS quantum dotsEFM measurementsElectrostatic force microscopy (EFM) studyMeV red shiftSingle quantum dotIndividual quantum dotsElectrostatic force microscopyOxide substratesTin-doped indium oxide (ITO) substratesRemoval of electronsForce microscopy studiesCdSe/ZnS quantum dotsIndium tin oxide (ITO) substrateFermi level mismatchStark effectUnambiguous signatureZnS quantum dotsTin oxide substratesRecombination energyPhotoluminescence imagingSpectral modulationExcess electrons