An induced annealing technique for SiPMs neutron radiation damage
Cordelli M, Diociaiuti E, Ferrari A, Miscetti S, Müller S, Pezzullo G, Sarra I. An induced annealing technique for SiPMs neutron radiation damage. Journal Of Instrumentation 2021, 16: t12012. DOI: 10.1088/1748-0221/16/12/t12012.Peer-Reviewed Original ResearchNeutron radiation damageSilicon Photo-MultipliersPhoto-MultipliersSource facilityDetector areaNeutron damageTotal fluenceSiPM arrayNeutron fluenceRadiation damageSiPMsFluencePixel sizeExperimental apparatusThermal dissipationAnnealing techniqueNeutronsDevicesHamamatsuCm2MM2 cellsAnnealingLeakageSensorsDissipation