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Sinard, John H.

Director, Pathology Informatics

Professor of Pathology and of Ophthalmology and Visual Science; Director, Pathology Informatics; Associate Director, Anatomic Pathology

Biography

John Sinard is a board-certified anatomic pathologist. He received his bachelor's degree from Harvard University, and his M.D. and Ph.D. degrees from Johns Hopkins. His residency training was at Yale-New Haven Hospital. He is the Associate Director of Anatomic Pathology and is active on the autopsy and surgical pathology services, with a specialty interest in ophthalmic pathology. He directs the Pathology Informatics Program, and has been developing software for over 30 years. His academic...

John Sinard is a board-certified anatomic pathologist. He received his bachelor's degree from Harvard University, and his M.D. and Ph.D. degrees from Johns Hopkins. His residency training was at Yale-New Haven Hospital. He is the Associate Director of Anatomic Pathology and is active on the autopsy and surgical pathology services, with a specialty interest in ophthalmic pathology. He directs the Pathology Informatics Program, and has been developing software for over 30 years. His academic interests are centered on translational informatics: delivering modern data management tools to practicing physicians and researchers.

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Gershkovich, Peter

Associate Director, Pathology Informatics

Associate Research Scientist in Pathology; Associate Director, Pathology Informatics

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