John H. Sinard MD, PhD

Professor of Pathology and of Ophthalmology and Visual Science; Vice Chair Pathology; Director, Anatomic Pathology; Director, Pathology Informatics

Biographical Info

John Sinard is a board-certified anatomic pathologist. He received his bachelor's degree from Harvard University, and his M.D. and Ph.D. degrees from Johns Hopkins. His residency training was at Yale-New Haven Hospital. He is the Vice Chair of Pathology and Director of Anatomic Pathology and is active on the autopsy and surgical pathology services, with a specialty interest in ophthalmic pathology. He directs the Pathology Informatics Program, and has been developing software for over 30 years. His academic interests are centered on translational informatics: delivering modern data management tools to practicing physicians and researchers.

Education & Training

Harvard University (1982)
Johns Hopkins University (1990)
Johns Hopkins University (1990)
Yale-New Haven Hospital, Anatomic Pathology (1990 - 1993)
Yale University School of Medicine, Anatomic Pathology (1993 - 1995)
Board Certification
Anatomic Pathology, Board Certified  (1994)
Board Certification
Clinical Informatics, Board Certified  (2014)
Board Certification
Pathology, Board Certified  (2014)

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